In this paper, a novel fatigue life prediction model for electronic components under non-Gaussian random vibration excitations is proposed based on random vibration and fatigue theory. This mathematical model comprehensively associates the vibration fatigue life of electronic components, the characteristics of vibration excitations (such as the root mean square, power spectral density, spectral bandwidth and kurtosis value) and the dynamic transfer characteristics of an electronic assembly (such as the natural frequency and damping ratio) together. Meanwhile a detailed solving method was also presented for determining the unknown parameters in the model. To verify the model, a series of random vibration fatigue accelerated tests were conducted. The results obtained show that the predicted fatigue life based on the model agreed with actual testing. This fatigue life prediction model can be used for the quantitative design of vibration fatigue accelerated testing, which can be applied to assess the long-term fatigue reliability of electronic components under Gaussian and non-Gaussian random vibration environments.